Bruker Completes Acquisition of the Atomic Force Microscopy and Optical Industrial Metrology Instruments Businesses from Veeco
Bruker Corporation today announced the closing of its acquisition of the Atomic Force Microscopy (AFM) and the Optical Industrial Metrology (OIM) instruments businesses from Veeco Instruments, Inc. for $229.4 million in cash.
The industry-leading AFM scientific instruments business headquartered in Santa Barbara, California, as well as the OIM business based in Tucson, Arizona, along with the global AFM/OIM field sales, applications and support organizations, have now become part of the Bruker Nano Division, which is part of the Bruker AXS Group, adding more than 350 employees in eleven countries. The 2009 revenues for the AFM and OIM instruments businesses were derived approximately 38% from Asia-Pacific, 31% from the Americas, and 31% from Europe, and in terms of customers approximately 45% from applied/industrial customers and 55% from academic/government customers.
The acquired AFM and OIM businesses are highly complementary to Bruker's existing systems and solutions, and the combined product portfolio transforms Bruker into a global leader in materials research and nanotechnology analysis instrumentation. In addition to the newly acquired AFM and OIM product lines, Bruker offers a broad range of high-performance X-Ray Diffraction (XRD), X-Ray Fluorescence (XRF), XRF microanalysis (XRF), vibrational spectroscopy (FTIR, NIR, Raman) and AFM hybrid (e.g. AFM-Raman, AFM-optical microscopy) systems, as well as EDS and EBSD analyzer accessories for third-party electron microscopes, all used for surface analysis in materials, life-science and nanotechnology R&D and quality control.
Source: Bruker AXS
More news from this company
- Bruker Announces Acquisition of SkyScan (04/03/2012)
- Bruker Announces Agreement to Acquire CETR (09/15/2011)
- Bruker Announces Agreement to Acquire Veeco's Scanning Probe Microscopy (SPM) and Optical Industrial Metrology (OIM) Scientific Instruments Business (08/27/2010)
- Prof. David C. Joy wins 2010 Duncumb Award for Excellence in Microanalysis (08/24/2010)
- Bruker AXS Microanalysis GmbH renamed Bruker Nano GmbH (02/24/2010)