Prof. David C. Joy wins 2010 Duncumb Award for Excellence in Microanalysis

Bruker Nano, in cooperation with The Microbeam Analysis Society, is proud to announce that the Duncumb Award for Excellence in Microanalysis has been awarded to David C. Joy, Distinguished Professor at the University of Tennessee, Knoxville, and Distinguished Scientist at the Oak Ridge National Laboratory. The award, sponsored by Bruker Nano, was presented at the Microscopy and Microanalysis 2010 meeting in Portland, OR. The Duncumb Award honors the seminal contributions to the field of microanalysis made by Peter Duncumb and is presented to a person that has made important contributions to this field, through technical accomplishment, leadership, and educational and professional activities.

Prof. Joy is an internationally acclaimed scientist and researcher in the fields of scanning electron microscopy (SEM), analytical electron microscopy, and microanalysis based upon electron and X-ray spectrometry. Throughout his outstanding career, he has contributed significantly to quantitative analysis with energy loss spectrometry, the development of detectors for SEM and TEM, electron-beam interactions, contrast mechanisms and the study of electronic materials with SEM.

Prof. David Joy has shown active leadership in his fields of study. He has served as President of both the Microbeam Analysis Society and the Microscopy Society of America, as well as Editor-in-Chief of Scanning. He is a Fellow of both The Microscopy Society of America and the Royal Microscopical Society. Additionally, Prof. Joy has published over 400 scientific papers as well as nine books. His current research interests include Monte Carlo modelling for electron and ion imaging and microanalysis, high performance microscopy using both electron and ion beams, and nano-scale metrology.

Source: Bruker Corp.